Field Emission Scanning Electron Microscope

Specification

Item JSM-7800F PRIME
Magnification ×25~×1,000,000
Accelerating voltage 10V~30kV
Spatial resolution 0.7nm
Probe current several pA ~ 500nA
Tilt angle －5~＋70°
Special detectors Energy Dispersive X-ray Spectrometer(EDS)

Feature

・Multiple detectors to acquire all information simultaneously